Efficacy and Safety of a Low-Energy Double-Pass 1450-nm Diode Laser for the Treatment of Acne Scars

Title : Efficacy and Safety of a Low-Energy Double-Pass 1450-nm Diode Laser for the Treatment of Acne Scars

Journal : Photomedicine and Laser Surgery Volume 30, Number 2, 2012
Author : Tamae Wada, M.D., Akira Kawada, M.D., Ph.D., Ayaka Hirao, M.D., Haruyo Sasaya, M.D., and Naoki Oiso, M.D., Ph.D.

Objective
The purpose of this study was to evaluate the efficacy and safety of a 1450-nm diode laser on acne scars in Asian patients. Background data: Acne and acne scars affect individuals during puberty and adolescence, and decrease their quality of life.

Methods
An open study was performed on 24 Japanese patients (17 female and 7 male, aged 15–44 years) with acne scars on the face treated with five sessions of low-energy doublepass 1450-nm diode laser at 4-week intervals. The mean duration of the acne scars prior to receiving laser therapy was 4.8 years (range 1–9). Clinical evaluation by physicians and with photographs was conducted at baseline, 1 month after the final treatment, and at a 3-month follow-up visit. Topical therapies for acne vulgaris were permitted during the follow-up period.

Results
All patients completed the five treatment sessions. Seventy-five percent of the subjects showed at least 30% improvement of acne scars. At the 3-month follow-up
evaluation, 92.9% of the subjects with > 30% improvement maintained the effectiveness. Vesicle formation and transient hyperpigmentation also occurred in one case.

Conclusions
The 1450-nm diode laser therapy was effective and well-tolerated in patients with acne scars, suggesting that this may be an appropriate modality for treating facial acne scars.


Clinical Data